Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C)
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 200 °C (min 30 °C, maks 200 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 200 °C (min 30 °C, maks 200 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 500 °C (min 30 °C, maks 500 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 500 °C (min 30 °C, maks 500 °C)
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Advanced Characterization of Morfology and EBSD Advanced Characterization of Morfology and EBSD
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Advanced Characterization of Morfology and EBSD
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Advance SEM Characterization with 1 EDS features (Point, Line, or Mapping) Advance SEM Characterization with 1 EDS features (Point, Line, or Mapping)
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Advance SEM Characterization with 1 EDS features (Point,…
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Advance SEM Characterization with 2 EDS Features (point & line, point & map, line & map) Advance SEM Characterization with 2 EDS Features (point & line, point & map, line & map)
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Advance SEM Characterization with 3 EDS features (Point, Line, or Mapping) Advance SEM Characterization with 3 EDS features (Point, Line, or Mapping)
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Advanced Characterization Transmission Electron Microscopy (TEM) Talos F200X Advanced Characterization Transmission Electron Microscopy (TEM) Talos F200X
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ADVANCED CHARACTERIZATION OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)/ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA) ADVANCED CHARACTERIZATION OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)/ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA)
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Additonal EDS features (point, line, & mapping) Additonal EDS features (point, line, & mapping)
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Additonal EDS features (point, line, & mapping)
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